AUTHORS: Hana Vaskova, Petr Neumann, Mikulas Kozubik, Karel Jelinek

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ABSTRACT: The paper deals with the potential of Raman spectroscopy as an analytical method for the authenticity assessment of electronic components. Electronic components are an integral part of the devices that people use in their daily activities. Incidence of counterfeit electronic components is an increasingly common phenomenon in our modern world that may compromise reliability, functionality and other related purposes of the devices. As the Raman spectroscopy provides detailed information on the material used, the focus of the Raman spectroscopic study of selected original components was given especially on materials of polymer-based and ceramic-based packages and markings. Knowledge of this information can help to distinguish between genuine and counterfeit component. The non-original component was revealed using other methods used in our workplace. Raman spectroscopy also confirmed the differences in materials of counterfeits compared to the original

KEYWORDS: Electronic, components, Raman spectroscopy, counterfeit, non-destructive, authenticity assessment.

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