Plenary Lecture

Advances in Digital X-Ray Detectors Constituted by Semiconductor Pixel Matrices

Professor Maria Rizzi
Dipartimento di Elettrotecnica ed Elettronica
Politecnico di Bari, Italy
Email: rizzi@deemail.poliba.it

Abstract: Digital radiography is an imaging modality that uses electronics and computational techniques with the aim to improve diagnostic quality parameters and to evolve new diagnostic modalities with reduced patient radiation exposure.
In the field of X-ray detection application, semiconductors such as Cadmium Telluride (CdTe) and GaAs characterized by high atomic mass could be used to fabricate detectors with high X-ray sensitivity.
Recently, to obtain a full characterization of X-ray pixel detectors, the team which I work in, designed and obtained for study purpose, structures fabricated in GaAs technology.
To relate the semiconductor characteristics to the induced current signal, a 3D numerical model was conceived by the team in which I work for detectors having different structures. Its validity has been proven in simulating both several different GaAs detector structures (micro-strip or pixel), taking into account also the particle incidence angles, and different materials such as CdTe and CdZnTe.

Brief Biography of the Speaker:
Maria Rizzi was born in Bari, Italy, in 1965. She received the Dr. Eng. degree and the Ph.D. in 1990 and 1994, respectively. She holds both research and teaching at the University "Politecnico di Bari." Her research mainly concerns the analysis and design of electro-optic and all-optic switches for MIN and GSN networks, the analysis and design of all-optical FSMs for ultra-high speed applications, the analysis and design of controllers for photonic networks and the analysis and design of detectors for digital radiography. In these fields, she is author of many papers published on international journals and on proceeding of international conferences.
She is editor of some books and referee for the WSEAS group, for Journal of Applied Sciences, for Information Technology Journal and for Trends in Applied Science Research.